• NMR Spectrometer - 400 MHz (Bruker)- funded by DST-FIST
• Transmission Electron Microscope (TEM) - FEI-Tecnai G2 20 Twin
• Field Emission-Scanning Electron Microscope (FE-SEM)- FEI Quanta 250 FEG
• GC-MS - Perkin Elmer
• Powder X-ray Diffractometer – (Bruker, D8 Advance) – funded by DST-FIST Internal | External | Specification
• Surface Area Analyzer - Quantachrome USA
• Thermo Gravimetry Analyzer (TGA) - TA Instruments, USA Sample submission form | TGA Instrument details
• CHNS Elemental Analyzer - Perkin Elmer - 2400 CHNS/O Series
• Total Organic Carbon Analyzer (Shimadzu)
• Nd:YAG laser, 1000 mJ (max), 1064 and 532 nm, 10 ns, 10 Hz, with vibration isolation support –  Model: LPY 674G-10, LITRON, UK.

Other Instrumental Facilities:

• FT-IR Spectrophotometer – IRaffinity 1, Shimadzu Internal Form | External Form
• Raman Spectroscopy ( = 536 nm) – Agiltron, USA
• Gas Chromatograph – Shimadzu
• UV Visible Spectrophotometer – JASCO (V-670 PC) Internal Form | External Form
• Fluorescence Spectrophotometer– HITACHI
• HPLC – Perkin-Elmer
• Electrochemical Workstation – CHI 660C, USA
• Materials Testing Machine – H5KS, Tinius Olsen Ltd, UK 
• Refractive Index Measurement setup-Prism Coupler –Metricon, USA
• Mitutoyo Microhardness Tester-with Vicker's & Knoop Indenter – CCD Camera
• Time domain  reflectometry – Agilent Technologies, USA
• Simultaneous Thermal Analyzer – SDTQ600, TA Instruments
• Water contact angle measurement (Gonimetry) – Phoenix 300, SEO, Korea
• Electrolytic polishing and etching machine – Struers Lectropol 5