• HIGH-RESOLUTION MASS SPECTROMETRY (HRMS) | Internal Form | External Form | Contact Us
• NMR Spectrometer - 400 MHz (Bruker)- funded by DST-FIST
• Transmission Electron Microscope (TEM) - FEI-Tecnai G2 20 Twin [HR-TEM] | Contact Us
• GC-MS - Perkin Elmer
• FT-IR Spectrophotometer | Internal Form | External Form | Contact Us
• Powder X-ray Diffractometer – (Bruker, D8 Advance) – funded by DST-FIST Internal | External | Specification
• Surface Area Analyzer - Quantachrome USA - Internal / External Form | Sample Submission form
• Thermo Gravimetry Analyzer (TGA) - TA Instruments, USA | Sample submission form | TGA Instrument Details and User Instruction
• CHNS Elemental Analyzer - Perkin Elmer - 2400 CHNS/O Series | Analysis Request Form
• Total Organic Carbon Analyzer (Shimadzu)
• Nd:YAG laser, 1000 mJ (max), 1064 and 532 nm, 10 ns, 10 Hz, with vibration isolation support –  Model: LPY 674G-10, LITRON, UK.
• UV Visible Spectrophotometer – JASCO (V-670 PC) Internal Form | External Form
• Single Crystal X-ray Diffraction Facility (SC-XRD) - Avail Now

Other Instrumental Facilities:

• Raman Spectroscopy ( = 536 nm) – Agiltron, USA
• Gas Chromatograph – Shimadzu
• Fluorescence Spectrophotometer– HITACHI
• HPLC – Perkin-Elmer
• Electrochemical Workstation – CHI 660C, USA
• Materials Testing Machine – H5KS, Tinius Olsen Ltd, UK 
• Refractive Index Measurement setup-Prism Coupler –Metricon, USA
• Mitutoyo Microhardness Tester-with Vicker's & Knoop Indenter – CCD Camera
• Time domain  reflectometry – Agilent Technologies, USA
• Simultaneous Thermal Analyzer – SDTQ600, TA Instruments
• Water contact angle measurement (Gonimetry) – Phoenix 300, SEO, Korea
• Electrolytic polishing and etching machine – Struers Lectropol 5